Nirasaki, Japan

Tadashi Obikane

This inventor holds 18 USPTO granted patents and 2 published patent applications, primarily in Semiconductor Probing. Top assignee: Tokyo Electron Limited. Active years: 1990-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tadashi Obikane. Retrieved from https://idiyas.com/inventor/tadashi-obikane

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 18 

% Patents Active = 55.6

Average Co-Inventor Count = 2.3

ph-index = 7

Forward Citations = 632(Granted Patents)


Location History:

  • Kofu, JP (1990 - 1998)
  • Nirasaki, JP (2002 - 2014)
  • Yamanashi, JP (2014)

Company Filing History:


Years Active: 1990-2026

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Areas of Expertise:
Wafer Inspection
Substrate Transfer
Probing Apparatus
Test Device
FOUP Device
Load Port
Imaging Unit
Electric Probing
Carrying-In/Out
Change Kit
Inspection Units
Head Plate Mechanism
18 patents (USPTO):Explore Patents

Title: Innovations by Tadashi Obikane: Advancements in Testing Technologies

Introduction

Tadashi Obikane, an accomplished inventor hailing from Nirasaki, Japan, has made significant contributions to the field of testing technology with a remarkable portfolio of 17 patents. His innovative approaches have paved the way for advancements in both rectangular and circular substrate testing methodologies.

Latest Patents

Among his latest innovations, Obikane has developed a test device featuring an exchangeable change kit designed to efficiently test different types of substrates. This device comprises a first holding device tailored for rectangular substrates and a second for circular substrates, which can be easily interchanged based on the substrate being evaluated. Furthermore, he has designed a novel inspection apparatus that includes a low-temperature inspection chamber. This system facilitates the precise low-dew-point inspection of various objects, utilizing a transfer device equipped with a transfer arm that streams the inspected object into the inspection chamber while effectively controlling the atmospheric conditions.

Career Highlights

Obikane’s career is intertwined with his role at Tokyo Electron Limited, a company renowned for its cutting-edge technology and innovation in the semiconductor industry. His efforts contribute significantly to improving testing processes and methodologies, showcasing his dedication to advancing the field.

Collaborations

Throughout his career, Obikane has worked alongside esteemed colleagues such as Shuji Akiyama and Hiroki Hosaka. This collaborative environment has undoubtedly fostered a culture of innovation, allowing Obikane to enhance his inventions and share knowledge within the team.

Conclusion

Tadashi Obikane stands out as a pivotal figure in the realm of innovation, particularly in the area of testing technologies. His numerous patents reflect his commitment to enhancing testing devices and methods, impacting the future of substrate inspections. With ongoing contributions and collaborations, Obikane continues to be a trailblazer in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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