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Company Filing History:
52 out of 90,594 
4 out of 54,638 
Years Active: 2006-2019
Title: The Innovative Contributions of Siu-Kei Tin
Introduction: Siu-Kei Tin, based in Milpitas, California, is a distinguished inventor recognized for his significant contributions to technology through his extensive portfolio of patents. With a remarkable collection of 52 patents, Tin has made considerable advancements in the field of object measurement, particularly concerning the shape and properties of specular objects.
Latest Patents: Tin's latest innovations encompass two notable patents. The first, titled "Measuring Shape of Specular Objects by Local Projection of Coded Patterns," introduces a method for measuring the shape of specular objects by illuminating them with a light field from spaced apart layers. These layers are designed to display multiple predetermined patterns relevant to a bounding volume where the object is positioned. This innovative approach allows for a precise coding of light rays to achieve accurate measurements.
The second patent, "Multispectral Binary Coded Projection Using Multiple Projectors," outlines a method for creating a depth map or assessing material properties of objects. This method involves positioning multiple projectors at various angles, with each projector featuring color channels that differ from others. By projecting a combined color pattern onto an object and capturing the resultant image, Tin's technique enables the recovery of depth maps or material properties through advanced calculations.
Career Highlights: Throughout his career, Siu-Kei Tin has been associated with prominent technology companies that have shaped his expertise. Notable among these are Canon and Microsoft Technology Licensing, LLC, where he contributed to pioneering projects that emphasize innovative technologies and complex imaging solutions.
Collaborations: Tin has collaborated with distinguished professionals in the field, including Francisco H. Imai and Jinwei Ye. These collaborations have facilitated the development of cutting-edge technologies and processes that enhance the understanding and measurement of object properties.
Conclusion: Siu-Kei Tin's innovative patents and collaborations reflect his commitment to advancing technological solutions in measuring object properties. His work not only contributes to the field of engineering and technology but also paves the way for future innovations that could revolutionize how we capture and analyze spatial information.
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