The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Oct. 29, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Siu-Kei Tin, Milpitas, CA (US);
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A method of measuring a depth map for an object or a material property of an object involves positioning multiple projectors at respectively multiple angular positions relative to an object. Each of the projectors comprises color channels whose colors differ from that of other projectors. An image capture device is positioned relative to the multiple projectors. A combined color pattern is projected onto the object using the multiple projectors. Each projector projects a color striped pattern whose resolution differs from that of others of the projectors and the resolution of the color striped pattern is related to the angular position of the projector. An image of the object is captured with the combined color pattern using the image capture device and a depth map or a material property of the object is recovered by calculations using the captured image.