The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2015

Filed:

Aug. 20, 2012
Applicants:

Siu-kei Tin, Milpitas, CA (US);

Francisco Imai, Mountain View, CA (US);

Inventors:

Siu-Kei Tin, Milpitas, CA (US);

Francisco Imai, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 9/02 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01B 11/30 (2013.01); G01B 11/303 (2013.01); G01N 21/474 (2013.01); G01B 9/02094 (2013.01); G01N 2021/479 (2013.01);
Abstract

A property of a material is determined. The material is illuminated with a light beam of controlled spectral and coherence properties. A stack of speckle field images is recorded from speckle fields reflected from the illuminated material in multiple spectral channels. The stack of speckle field images includes multiple speckle field images each being recorded in a respectively different spectral channel. Statistical properties of the speckle field images in the stack of speckle field images are analyzed to determine at least one property of the illuminated material.


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