The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jan. 07, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Siu-Kei Tin, Milpitas, CA (US);
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G06T 7/00 (2006.01); G06K 9/00 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/00577 (2013.01); G06K 9/2018 (2013.01); G06K 9/2036 (2013.01);
Abstract
Systems, devices, and methods for classifying a sample by material type measure a reflection of a sample at an illumination angle and an observation angle in at least two spectral bands, calculate a feature value for the sample based on an estimated ratio value of the at least two spectral bands of the measured reflection, and classify the sample based on the feature value.