The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

Mar. 21, 2012
Applicant:

Siu-kei Tin, Milpitas, CA (US);

Inventor:

Siu-Kei Tin, Milpitas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0203 (2013.01); G06T 7/002 (2013.01);
Abstract

Stereoscopic image capture is provided. A blur value expected for multiple pixels in left and right images is predicted. The blur value is predicted based on designated capture settings. A disparity value expected for multiple pixels in the left and right images is predicted. The disparity value is predicted based on the designated capture settings. Stressed pixels are identified by comparing the predicted disparity value to a lower bound of disparity value determined from the predicted blur value using a predetermined model. A pixel with predicted disparity value less than the lower bound is identified as a stressed pixel. The predicted disparity is adjusted by modifying the designated capture settings to reduce the number of stressed pixels, or an alert to the presence of stressed pixels is given to the user.


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