The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2017
Filed:
Sep. 17, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Siu-Kei Tin, Milpitas, CA (US);
Mahdi Nezamabadi, San Jose, CA (US);
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01B 11/22 (2006.01); H04N 5/235 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); G06T 7/521 (2017.01); H04N 5/2351 (2013.01);
Abstract
A depth value is measured. An image is captured of an object illuminated by one or more light patterns effected by multiple pixel-layers. Each pixel-layer includes an array of pixels. A direction of incoming illumination is determined for a specular reflection at a point on the surface of the object. The depth value of the point on the surface of the object is determined based on the captured image and the direction of incoming illumination.