Yongin-si, South Korea

Sang-kil Lee

USPTO Granted Patents = 30 

Average Co-Inventor Count = 3.9

ph-index = 5

Forward Citations = 69(Granted Patents)


Location History:

  • Kyungki-do, KR (1998 - 2001)
  • Suwon-si, KR (2005 - 2010)
  • Yongin-si, KR (2008 - 2019)

Company Filing History:


Years Active: 1998-2019

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30 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Sang-kil Lee

Introduction

Sang-kil Lee is a prominent inventor based in Yongin-si, South Korea, known for his significant contributions to the field of semiconductor technology. With a remarkable portfolio that includes 30 patents, Lee has made a lasting impact on the processes involved in wafer inspection and surface analysis.

Latest Patents

Two of Sang-kil Lee's latest patents exemplify his pioneering approach in technology. The first, titled "Method of inspecting wafer using electron beam," presents a detailed process. This method involves loading a wafer onto a stage and positioning it for inspection, where multiple electron beam columns are utilized to scan the dies on the wafer. The result is a comprehensive die image derived from the combination of partial images obtained during scanning.

The second patent, titled "Surface inspecting method," outlines an innovative approach to surface inspection. This method requires the irradiation of an incident light beam with a specific polarized state onto a target object. The subsequent measurement of the reflected light beam's polarized state allows for thorough inspection based on the variations observed, thereby enhancing the accuracy of surface assessments.

Career Highlights

Sang-kil Lee is currently employed at Samsung Electronics Co., Ltd., a leading company in the field of electronics and technology. His work at Samsung is characterized by a focus on developing advanced inspection techniques that are essential for the production and quality assurance of semiconductor devices.

Collaborations

Throughout his career, Lee has collaborated with talented peers, including Yu-sin Yang and Chung-sam Jun. These collaborations have bolstered his innovative endeavors and have played a crucial role in advancing the technologies surrounding wafer inspection and surface analysis.

Conclusion

Sang-kil Lee’s contributions to the semiconductor industry continue to shape the landscape of technology. With his patented methods and ongoing dedication to innovation, he remains a key figure within Samsung Electronics Co., Ltd. and the broader field of semiconductor research and development. His work not only enhances product quality but also drives forth the evolution of inspection technologies essential for modern electronics manufacturing.

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