The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Dec. 18, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Min-Kook Kim, Goyang, KR;

Bang-Won Kim, Seoul, KR;

Yu-Sin Yang, Seoul, KR;

Young-Jee Yoon, Yongin-si, KR;

Sang-Kil Lee, Yongin-si, KR;

Yoo-Seok Jang, Seoul, KR;

Chung-Sam Jun, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/16 (2006.01); H01L 21/66 (2006.01); C30B 29/40 (2006.01); C30B 29/52 (2006.01);
U.S. Cl.
CPC ...
H01L 22/26 (2013.01); C30B 25/165 (2013.01); C30B 29/40 (2013.01); C30B 29/52 (2013.01); H01L 22/12 (2013.01);
Abstract

An apparatus and method of forming an epitaxial layer are provided. The apparatus includes a process chamber in which an epitaxial process is performed to form epitaxial layer on a substrate. A first supplier supplies source gases for the epitaxial layer into the process chamber. A second supplier supplies dopants into the process chamber. A detector detects a composition ratio of the epitaxial layer and a concentration of the dopants in the epitaxial layer during the epitaxial growth process. And a controller controls a mass flow of at least one of the source gases and a mass flow of the dopants in-line with the epitaxial growth process. Accordingly, the layer thickness of the epitaxial layer can be accurately controlled in real time in line with the epitaxial process.


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