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For the Inventor, By the Inventor

Seoul, South Korea

Yu-sin Yang

This inventor holds 54 USPTO granted patents and 8 published patent applications, primarily in Semiconductor Inspection (CPC class G01N). Top assignees: Samsung Electronics Co., Ltd., Korea Advanced Institute of Science and Technology. Active years: 2004-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-sin Yang. Retrieved from https://idiyas.com/inventor/yu-sin-yang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 54 

% Patents Active = 70.4

Average Co-Inventor Count = 4.8

ph-index = 5

Forward Citations = 108(Granted Patents)

Forward Citations (Not Self Cited) = 102(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal54 out of 132,108 
 
Samsung Electronics Co., Ltd.
 patents
silverMedal1 out of 2,790 
 
Korea Advanced Institute of Science and Technology
 patents
where one patent can have more than one assignee

Years Active: 2004-2022

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Areas of Expertise:
Thickness Measurement
Defect Detection
Optical Measurement
Semiconductor Device
Hyperspectral Imaging
Wafer Inspection
Surface Inspection
Microelectronic Substrate
Broadband Light Source
Electron Beam Inspection
Atomic Force Microscope
Three-Dimensional Qualification
54 patents (USPTO):Explore Patents
1. 11494642 - Thickness prediction network learning method, semiconductor device manufacturing method, and semiconductor material deposition equipment (2022-11-08),
2. 11181831 - Methods of manufacturing semiconductor device (2021-11-23),
3. 11043433 - Method of inspecting surface and method of manufacturing semiconductor device (2021-06-22),
4. 11037283 - Inspecting apparatus based on hyperspectral imaging (2021-06-15),
5. 10989520 - Methods for nondestructive measurements of thickness of underlying layers (2021-04-27),
6. 10969428 - Method of inspecting pattern defect (2021-04-06),
7. 10593032 - Defect inspection method and defect inspection apparatus (2020-03-17),
8. 10527556 - Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same (2020-01-07),
9. 10373796 - Method of inspecting wafer using electron beam (2019-08-06),
10. 10249544 - Method of inspecting surface and method of manufacturing semiconductor device (2019-04-02),
11. 10001444 - Surface inspecting method (2018-06-19),
12. 9897552 - Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system (2018-02-20),
13. 9892983 - Apparatus for forming a thin layer and method of forming a thin layer on a substrate using the same (2018-02-13),
14. 9831626 - Broadband light source and optical inspector having the same (2017-11-28),
15. 9733178 - Spectral ellipsometry measurement and data analysis device and related systems and methods (2017-08-15),

Title: Inventor Yu-sin Yang

Introduction: Yu-sin Yang is a renowned inventor based in Seoul, South Korea, known for his groundbreaking contributions to various fields through his innovative creations.

Latest Patents: Yu-sin Yang holds several patents in the areas of technology and healthcare, with his most recent inventions focusing on sustainable energy solutions and medical devices.

Career Highlights: Throughout his career, Yu-sin Yang has been recognized for his exceptional problem-solving skills and ability to think outside the box. He has received numerous awards for his inventions, solidifying his reputation as a leading innovator in the industry.

Collaborations: Yu-sin Yang has collaborated with top research institutions and universities both locally and internationally to further develop his inventions and bring them to market. His partnerships have led to successful commercialization of his patented technologies.

Conclusion: In conclusion, Yu-sin Yang's dedication to innovation and his passion for creating solutions to real-world problems have established him as a prominent figure in the world of inventors. His work continues to inspire future generations of innovators to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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