Company Filing History:

9 out of 2,874

Hitachi-high-technologies Corporation

Hitachi-science Systems, Ltd.

patents

where one patent can have more than one assignee

Years Active: 1987-2012

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18 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 8193493 - Charged particle beam apparatus (2012-06-05),

2. 7906761 - Charged particle beam apparatus (2011-03-15),

3. 7880143 - Electron beam apparatus (2011-02-01),

4. 7855363 - Inspection method and apparatus using an electron beam (2010-12-21),

5. 7425704 - Inspection method and apparatus using an electron beam (2008-09-16),

6. 7271385 - Inspection method and inspection apparatus using electron beam (2007-09-18),

7. 7081625 - Charged particle beam apparatus (2006-07-25),

8. 7071468 - Circuit pattern inspection method and its apparatus (2006-07-04),

9. 7034298 - Inspection method and apparatus using an electron beam (2006-04-25),

10. 6566654 - Inspection of circuit patterns for defects and analysis of defects using a charged particle beam (2003-05-20),

11. 5195070 - Optical information processing apparatus and optical pickup therefor (1993-03-16),

12. 5134298 - Beam control method and apparatus (1992-07-28),

13. 5125740 - Method and apparatus for measuring optical constants of a thin film as (1992-06-30),

14. 5121449 - Information detecting system of scanning type (1992-06-09),

15. 5008702 - Exposure method and apparatus (1991-04-16),

Title: The Inventor Extraordinaire: Ryuichi Funatsu's Trailblazing Contributions to Innovation

Introduction:

Ryuichi Funatsu, a visionary inventor hailing from Hitachinaka, Japan, has left an indelible mark on the world of inventions. With a total of 18 patents to his name, Funatsu's pioneering spirit and commitment to pushing the boundaries of technology have set him apart as a true trailblazer in the realm of innovation.

Latest Patents:

One of Funatsu's latest patents includes a groundbreaking Charged Particle Beam Apparatus designed for a multi-beam type semiconductor inspection apparatus. This invention showcases his dedication to achieving both high defect-detection sensitivity and inspection speed for samples with diverse properties. By making the allocation of the primary beam on the samples changeable and optimizing various optical and apparatus parameters, Funatsu has revolutionized the semiconductor inspection process.

Career Highlights:

Throughout his illustrious career, Ryuichi Funatsu has made significant contributions to companies like Hitachi High-Technologies Corporation and Hitachi Co., Ltd. His innovative spirit and technical expertise have played a pivotal role in driving technological advancements within these esteemed organizations, shaping the landscape of modern innovation.

Collaborations:

Funatsu's collaborative efforts with industry peers such as Akira Inagaki and Taku Ninomiya have further enriched the realm of inventions. Together, they have worked relentlessly to develop cutting-edge technologies and address complex challenges in the field of semiconductor inspection, illustrating the power of collaboration in driving forward progress and innovation.

Conclusion:

In conclusion, Ryuichi Funatsu stands as a beacon of inspiration for future generations of inventors and innovators. His relentless pursuit of innovation, coupled with his strategic collaborations and groundbreaking patents, has solidified his legacy as a forward-thinker and inventor par excellence. Funatsu's impact on the world of inventions is truly undeniable, and his contributions will continue to shape the future of innovation for years to come.

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Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.