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Ryoichi Takagi

USPTO Granted Patents = 11

Average Co-Inventor Count = 1.8

ph-index = 7

Forward Citations = 181(Granted Patents)

Location History:

Hyogo, JP (1990 - 1995)
Tokyo, JP (1998 - 2006)

Company Filing History:

10 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

Renesas Technology Corp.

Years Active: 1990-2006

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11 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7080302 - Semiconductor device and test system therefor (2006-07-18),

2. 6704897 - Semiconductor device and the test system for the same (2004-03-09),

3. 6486690 - Device under test board and testing method (2002-11-26),

4. 6356096 - Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path (2002-03-12),

5. 6282680 - Semiconductor device (2001-08-28),

6. 6150831 - Test method and device for semiconductor circuit (2000-11-21),

7. 5969533 - Probe card and LSI test method using probe card (1999-10-19),

8. 5844263 - Semiconductor integrated device having independent circuit blocks and a (1998-12-01),

9. 5436559 - Method for testing semiconductor device (1995-07-25),

10. 5266894 - Apparatus and method for testing semiconductor device (1993-11-30),

11. 4961052 - Probing plate for wafer testing (1990-10-02),

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