The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1995
Filed:
Aug. 23, 1993
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241581 ; 324765 ; 371 251 ;
Abstract
A method of testing a semiconductor device operating according to predetermined testing information. An output signal of the semiconductor device is received through a signal transmission line and a reference voltage is generated in accordance with an expected logical level of the output signal. The reference voltage is compared with a voltage of the output signal thus received and a current flow is supplied to the signal transmission line in accordance with the result. A logical level of the output signal thus received is determined and a decision is made whether the semiconductor device operates correctly.