The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1993
Filed:
Dec. 11, 1991
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A semiconductor testing apparatus includes a comparator for receiving a signal output to a pin terminal of a semiconductor device under test through a transmission line and determining a logical level of the received signal. Semiconductor testing apparatus 1 further includes a current supply circuit for comparing a voltage of an input terminal of comparator with a reference voltage applied by reference voltage sources and supplying a current to transmission line. When a signal ringing on transmission line and a reflection with undershoot and overshoot at input terminal occur, current supply circuit supplies a current to transmission line in accordance with a relationship of magnitude between the voltage at input terminal and the reference voltage. The current supply to transmission line is made to inhibit the overshoot and undershoot of the signal. This allows comparator to carry out a functional testing and a measurement of DC/AC characteristics of a semiconductor device at precise timing and at high speed.