The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2004
Filed:
Sep. 26, 2000
Applicant:
Inventor:
Ryoichi Takagi, Tokyo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A test system includes a semiconductor device having a circuit configuration including an input buffer circuit, an output buffer circuit, and an internal logic, a random data generation circuit being provided at the front stage of the output buffer circuit; a random data generator, incorporating a random data generation circuit, for applying a random data to an input of the input buffer circuit from the random data generation circuit; and a test board on which the semiconductor device and random data generator is mounted and electrically connected to each other.