San Jose, CA, United States of America

Raghav Babulnath

USPTO Granted Patents = 9 

Average Co-Inventor Count = 3.8

ph-index = 3

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2016-2020

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9 patents (USPTO):Explore Patents

Title: **Raghav Babulnath: Innovating Defect Detection in Semiconductor Manufacturing**

Introduction

Raghav Babulnath is a prominent inventor based in San Jose, California, known for his significant contributions to the field of semiconductor manufacturing. With an impressive portfolio of 9 patents, Raghav has pioneered advancements in defect inspection processes that enhance the efficiency and accuracy of wafer production.

Latest Patents

Among his latest innovations, Raghav has developed a patent titled "Inspection for multiple process steps in a single inspection process." This invention introduces various embodiments that facilitate the detection of defects on a wafer by acquiring output generated during inspections performed post multiple process steps. The method detects defects based on their position relative to separate design portions on the wafer, effectively associating defect regions with corresponding process steps.

Another notable patent of Raghav’s is "Creating defect samples for array regions." This method involves detecting and stacking defects found within an array region that encompasses multiple array cell types. Raghav’s technique enhances defect analysis by overlaying design information, allowing for the creation of sample defects that aid in further assessment and improvement of semiconductor production methods.

Career Highlights

Raghav currently works for KLA-Tencor Corporation, a leading company in the semiconductor equipment and software industry. His innovative approaches and commitment to advancing defect detection technology have placed him at the forefront of his field, continuously driving improvements in manufacturing processes.

Collaborations

Throughout his career, Raghav has had the pleasure of working alongside talented colleagues such as Lisheng Gao and Satya Kurada. Together, they contribute to the advancement of technologies that enhance the reliability and quality of semiconductor devices.

Conclusion

Raghav Babulnath's noteworthy achievements in patenting and development affirm his position as an influential figure in the world of semiconductor innovation. His persistent dedication to improving defect detection methods not only aids manufacturers but also pushes the boundaries of what is possible in wafer fabrication. As the semiconductor industry continues to evolve, innovators like Raghav will play a crucial role in shaping its future.

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