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San Antonio, TX, United States of America

Pierre Leroux

This inventor holds 31 USPTO granted patents, primarily in Semiconductor Processing. Top assignees: Vlsi Technology, Inc., Koninklijke Philips Corporation N.v., Nxp B.v.. Active years: 1994-2011.

USPTO Granted Patents = 31

% Patents Active = 77.4

Average Co-Inventor Count = 1.5

ph-index = 9

Forward Citations = 199(Granted Patents)

Company Filing History:

13 out of 1,083

Vlsi Technology, Inc.

patents

10 out of 21,885

Koninklijke Philips Corporation N.v.

Philips Semiconductor, Inc.

patents

5. 1 out of 16

Vsli Technology, Inc.

patents

Years Active: 1994-2011

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Areas of Expertise:

Wafer Target Design

Stepper Alignment

Rotational Error

Misalignment Measurement

Optical Proximity Corrections

Particle Removal

Dimensional Anomalies

Calibration Wafer

Illumination Exposure Dosage

Defect Monitoring

Focus/Exposure Matrix

Electrostatic Apparatus

31 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7868473 - Wafer target design and method for determining centroid of wafer target (2011-01-11),

2. 7709166 - Measuring the effect of flare on line width (2010-05-04),

3. 7556900 - Measuring the effect of flare on line width (2009-07-07),

4. 7556893 - Self-compensating mark design for stepper alignment (2009-07-07),

5. 7442474 - Reticle for determining rotational error (2008-10-28),

6. 7332255 - Overlay box structure for measuring process induced line shortening effect (2008-02-19),

7. 7067931 - Self-compensating mark design for stepper alignment (2006-06-27),

8. 7054007 - Calibration wafer for a stepper (2006-05-30),

9. 6950187 - Method for determining rotational error portion of total misalignment error in a stepper (2005-09-27),

10. 6889162 - Wafer target design and method for determining centroid of wafer target (2005-05-03),

11. 6800403 - Techniques to characterize iso-dense effects for microdevice manufacture (2004-10-05),

12. 6671048 - Method for determining wafer misalignment using a pattern on a fine alignment target (2003-12-30),

13. 6639676 - Method for determining rotational error portion of total misalignment error in a stepper (2003-10-28),

14. 6544859 - Semiconductor processing methods and structures for determining alignment during semiconductor wafer processing (2003-04-08),

15. 6541283 - Method for determining magnification error portion of total misalignment error in a stepper (2003-04-01),

Title: Pierre Leroux - Innovative Inventor from San Antonio

Introduction: Pierre Leroux is a renowned inventor based in San Antonio, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: Pierre Leroux holds several patents in the fields of renewable energy, sustainable agriculture, and advanced robotics, showcasing his diverse range of expertise.

Career Highlights: With over two decades of experience in the innovation sector, Pierre Leroux has successfully developed cutting-edge technologies that have revolutionized the way we approach environmental challenges and automation processes.

Collaborations: Throughout his career, Pierre Leroux has collaborated with leading research institutions, universities, and tech companies to further enhance his inventions and bring them to the market successfully.

Conclusion: Pierre Leroux's passion for innovation and his commitment to creating a sustainable future through his inventions make him a key figure in the world of inventors and patent holders.

Profile summary based on public USPTO records.

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