Peter David Engblom

Title: Innovator Spotlight: Peter David Engblom

Introduction:

Peter David Engblom, a prolific inventor based in Portland, OR, has made significant contributions to the field of metrology and semiconductor manufacturing. With a total of 8 patents to his name, Engblom's innovative methods have revolutionized these industries.

Latest Patents:

Engblom's latest patents showcase his prowess in developing cutting-edge technologies. One such patent is the "Metrology Method," which involves receiving images from a metrology tool, analyzing individual units in the image, and discriminating units that provide accurate metrology values. Another notable invention is the "Method for Characterizing a Manufacturing Process of Semiconductor Devices," which involves determining characteristics of manufacturing processes based on statistical parameters and probability of defective manufacture.

Career Highlights:

Currently employed at ASML Netherlands B.V., a renowned technology company in the field of semiconductor manufacturing, Engblom continues to push the boundaries of innovation. His expertise and dedication have led to the successful implementation of novel techniques in the industry.

Collaborations:

Engblom collaborates with esteemed colleagues at ASML Netherlands B.V., including Arie Jeffrey Den Boef and Kaustuve Bhattacharyya. Together, they form a dynamic team driving advancements in metrology and semiconductor manufacturing.

Conclusion:

In conclusion, Peter David Engblom stands out as a visionary inventor whose work has left a lasting impact on the tech industry. Through his dedication to innovation and collaboration with industry experts, Engblom continues to shape the future of metrology and semiconductor manufacturing.