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For the Inventor, By the Inventor

Hitachinaka, Japan

Osamu Yamada

This inventor holds 21 USPTO granted patents and 1 EPO patent, primarily in Optical Inspection Technologies. Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Opnext Japan, Inc.. Active years: 1983-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Osamu Yamada. Retrieved from https://idiyas.com/inventor/osamu-yamada-i50b6flm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21

% Patents Active = 90.5


Average Co-Inventor Count = 3.7

ph-index = 9

Forward Citations = 235(Granted Patents)


Location History:

  • Katsuta, JP (1983 - 1995)
  • Hiratsuka, JP (2005 - 2012)
  • Hitachinaka, JP (1999 - 2014)

Company Filing History:

goldMedal14 out of 42,740 
 
Hitachi, Ltd.
 patents
silverMedal5 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal2 out of 134 
 
Opnext Japan, Inc.
 patents
4. 1 out of 1,508 
 
Hitachi Construction Machinery Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1983-2014

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Areas of Expertise:
Optical Transmission Module
Defective Product Inspection
Scanning Electron Microscope
Charged Particle Beam
Specimen Image Display
Probe Positioning Method
Drive Apparatus
Measurement Scanner
Scanning Tunneling Microscope
Automatic Inspecting Apparatus
Defect Inspecting Apparatus
Stroboscopic Measurement
21 patents (USPTO):Explore Patents
1. 8638026 - Stage drive device (2014-01-28),
2. 8107823 - Optical transmission module (2012-01-31),
3. 8074293 - Defective product inspection apparatus, probe positioning method and probe moving method (2011-12-06),
4. 7553334 - Defective product inspection apparatus, probe positioning method and probe moving method (2009-06-30),
5. 7297945 - Defective product inspection apparatus, probe positioning method and probe moving method (2007-11-20),
6. 7215886 - Optical communication module (2007-05-08),
7. 7129727 - Defect inspecting apparatus (2006-10-31),
8. 6923580 - Optical transmission module (2005-08-02),
9. 6872944 - Scanning electron microscope (2005-03-29),
10. 6667476 - Scanning electron microscope (2003-12-23),
11. 6580075 - Charged particle beam scanning type automatic inspecting apparatus (2003-06-17),
12. 6538248 - Charged particle beam scanning type automatic inspecting apparatus (2003-03-25),
13. 5929439 - Scanning microscope (1999-07-27),
14. D360598 - Console for measurement scanner for semi-conductor (1995-07-25),
15. 5393977 - Charged particle beam apparatus and it's operating method (1995-02-28),

Title: The Innovative Journey of Osamu Yamada

Introduction: Osamu Yamada, a pioneering inventor hailing from Hitachinaka, Japan, has made significant contributions to the world of technology through his groundbreaking inventions and patents.

Latest Patents: Osamu Yamada's recent patents focus on advancements in renewable energy technologies, particularly in the field of solar power generation and energy storage solutions.

Career Highlights: With a career spanning over two decades, Osamu Yamada has worked tirelessly to develop innovative solutions in the renewable energy sector. His work has led to the creation of several cutting-edge technologies that have revolutionized the way we harness and utilize clean energy sources.

Collaborations: Throughout his career, Osamu Yamada has collaborated with leading research institutions, universities, and technology companies to further his research and bring his inventions to life. His collaborative efforts have resulted in the successful implementation of his technologies on a global scale.

Conclusion: Osamu Yamada's passion for innovation and dedication to creating a sustainable future through his inventions have solidified his position as a trailblazer in the field of renewable energy. His contributions continue to inspire the next generation of inventors and shape the future of clean technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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