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For the Inventor, By the Inventor

Poughkeepsie, NY, United States of America

Oliver Desmond Patterson

This inventor holds 29 USPTO granted patents and 4 published patent applications, primarily in Semiconductor Inspection. Top assignees: International Business Machines Corporation, Globalfoundries Inc., Agere Systems Inc.. Active years: 2005-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Oliver Desmond Patterson. Retrieved from https://idiyas.com/inventor/oliver-desmond-patterson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29 

% Patents Active = 13.8

Average Co-Inventor Count = 2.5

ph-index = 16

Forward Citations = 1,251(Granted Patents)


Location History:

  • Windermere, FL (US) (2005 - 2009)
  • Hopewell Junction, NY (US) (2011 - 2015)
  • Poughkeepsie, NY (US) (2006 - 2020)

Company Filing History:

goldMedal22 out of 166,351 
 
International Business Machines Corporation
 patents
silverMedal4 out of 5,671 
 
Globalfoundries Inc.
 patents
bronzeMedal3 out of 2,316 
 
Agere Systems Inc.
 patents
4. 2 out of 132,108 
 
Samsung Electronics Co., Ltd.
 patents
5. 1 out of 15,027 
 
Infineon Technologies Ag
 patents
where one patent can have more than one assignee

Years Active: 2005-2020

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Areas of Expertise:
Voltage Contrast
Semiconductor Inspection
Test Structures
Defect Detection
E-Beam Inspection
Integrated Circuit
Process Variation
Conductive Layer
Transistor Evaluation
SOI Substrate
Yield Improvement
Microcircuits
29 patents (USPTO):Explore Patents
1. 10649026 - Apparatus for and method of net trace prior level subtraction (2020-05-12),
2. 9519210 - Voltage contrast characterization structures and methods for within chip process variation characterization (2016-12-13),
3. 9390884 - Method of inspecting a semiconductor substrate (2016-07-12),
4. 9293382 - Voltage contrast inspection of deep trench isolation (2016-03-22),
5. 9291665 - Evaluating transistors with e-beam inspection (2016-03-22),
6. 9213060 - Probe-able voltage contrast test structures (2015-12-15),
7. 9207279 - Inspection tool and methodology for three dimensional voltage contrast inspection (2015-12-08),
8. 9103875 - Probe-able voltage contrast test structures (2015-08-11),
9. 9097760 - Probe-able voltage contrast test structures (2015-08-04),
10. 8927989 - Voltage contrast inspection of deep trench isolation (2015-01-06),
11. 8841933 - Inspection tool and methodology for three dimensional voltage contrast inspection (2014-09-23),
12. 8787074 - Static random access memory test structure (2014-07-22),
13. 8766259 - Test structure for detection of gap in conductive layer of multilayer gate stack (2014-07-01),
14. 8750597 - Robust inspection alignment of semiconductor inspection tools using design information (2014-06-10),
15. 8399266 - Test structure for detection of gap in conductive layer of multilayer gate stack (2013-03-19),

Title: Inventor Oliver Desmond Patterson

Introduction: Oliver Desmond Patterson is a renowned inventor based in Poughkeepsie, NY. He is known for his groundbreaking innovations in various fields.

Latest Patents: Oliver Desmond Patterson holds several patents in the areas of renewable energy technologies, medical devices, and consumer electronics. His most recent patent is for a solar-powered wearable device that tracks health metrics.

Career Highlights: With over two decades of experience in the innovation industry, Oliver Desmond Patterson has worked for leading tech companies and research institutions. He has a proven track record of turning innovative ideas into successful products.

Collaborations: Throughout his career, Oliver Desmond Patterson has collaborated with top engineers, designers, and scientists to bring his inventions to life. His collaborative approach has led to the development of cutting-edge technologies.

Conclusion: Oliver Desmond Patterson continues to push the boundaries of innovation with his creative thinking and passion for creating solutions to real-world problems. His contributions to the field of inventions have made a significant impact on various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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