Kokubunji, Japan

Noritsugu Takahashi

This inventor holds 27 USPTO granted patents and 2 published patent applications, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi, Ltd.. Active years: 2004-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Noritsugu Takahashi. Retrieved from https://idiyas.com/inventor/noritsugu-takahashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 27 

% Patents Active = 81.5

Average Co-Inventor Count = 4.8

ph-index = 5

Forward Citations = 84(Granted Patents)


Location History:

  • Hitachinaka, JP (2008 - 2012)
  • Kokubunji, JP (2004 - 2016)
  • Tokyo, JP (2016 - 2022)

Company Filing History:


Years Active: 2004-2022

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Areas of Expertise:
Charged Particle Beam
Scanning Electron Microscope
Inspection Device
Defect Review
High-Resolution Observation
Wafer Inspection
Electron Beam Device
Sample Inspection
Semiconductor Laser Diode
Measurement Device
Charged Particle Instrument
Data Handling
27 patents (USPTO):Explore Patents

Title: Noritsugu Takahashi: A Pioneer in Charged Particle Beam Technology

Introduction

Noritsugu Takahashi, based in Kokubunji, Japan, is a distinguished inventor recognized for his contributions to the field of charged particle beam technology. With an impressive portfolio that includes 27 patents, Takahashi has made significant advancements that enhance imaging quality and inspection processes within various applications.

Latest Patents

Among his latest innovations, one notable patent is the Charged Particle Beam Device. This device is designed to generate images with uniform quality across different fields of view. It incorporates a beam source that irradiates samples with charged particle beams and features a diaphragm for angle discrimination of secondary charged particles. The innovative design includes two detectors and an image generation unit that synthesizes signals to produce high-quality composite images.

Another groundbreaking invention is the Inspection Device, which incorporates a charged particle optical system. This system includes a beam source and multiple lenses that focus charged particle beams onto samples. It also features a calculation unit that facilitates auto-focusing while the field of view moves over several inspection spots, enhancing the effectiveness of the imaging process through astigmatism adjustments.

Career Highlights

Noritsugu Takahashi has contributed his expertise to notable organizations including Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His work in these companies has focused on advancing technologies related to charged particle beams and their applications in various industries.

Collaborations

Throughout his career, Takahashi has collaborated with talented coworkers such as Muneyuki Fukuda and Naomasa Suzuki. These partnerships have fostered a dynamic environment for innovation and have played a crucial role in the development of his groundbreaking technologies.

Conclusion

Noritsugu Takahashi's innovative spirit and dedication to advancing charged particle beam technology have made him a prominent figure in the field. His extensive patent portfolio reflects his commitment to enhancing image quality and inspection processes, paving the way for future innovations in the industry. Through his work, Takahashi continues to inspire aspiring inventors and contribute to the evolving landscape of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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