Norihiko Hana

Title: Norihiko Hana: Innovator in Structural Analysis Technologies

Introduction

Norihiko Hana is a prominent inventor based in Tokyo, Japan, known for his significant contributions to the field of structural analysis and failure diagnosis. With a total of 10 patents to his name, Hana has developed innovative technologies that enhance the understanding and management of structural integrity in various applications.

Latest Patents

Hana's latest patents include a range of advanced devices and methods aimed at improving the reliability of rotating machines. His inventions encompass a crack estimation device, a failure diagnosis device, a crack estimation method, and a failure diagnosis method. These technologies utilize a shape model setting circuitry that establishes a shape model of a target structure, identifying crack candidate planes and observation planes. The estimation model generator creates an estimation model through numerical analysis, allowing for the assessment of crack positions and sizes using probabilistic inference. Additionally, his deformation calculation device employs digital image correlation to accurately measure and analyze deformations in measurement regions.

Career Highlights

Throughout his career, Norihiko Hana has worked with esteemed organizations such as Mitsubishi Electric Corporation and Mitsubishi Electric Research Laboratories, Inc. His experience in these companies has allowed him to refine his expertise in structural analysis and contribute to groundbreaking innovations in the field.

Collaborations

Hana has collaborated with notable colleagues, including Masao Akiyoshi and Kenji Amaya, further enhancing the impact of his work through shared knowledge and expertise.

Conclusion

Norihiko Hana's contributions to structural analysis technologies have positioned him as a leading inventor in his field. His innovative patents and collaborative efforts continue to influence advancements in failure diagnosis and crack estimation methods.