The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Oct. 14, 2021
Mitsubishi Electric Corporation, Tokyo, JP;
Shigetaka Saji, Tokyo, JP;
Norihiko Hana, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
The deformation calculation device includes: a deformation calculation unit which obtains a simply-calculated deformation of a measurement region by digital image correlation; a viewpoint change elimination unit which obtains a provisional deformation by subtracting, from the simply-calculated deformation, an apparent strain that is back-calculated on an assumption that there is no deformation in the measurement region; and a uniting unit which outputs, as a deformation of the measurement region from the first image-taking period to the second image-taking period, a deformation resulting from averaging the provisional deformations obtained by applying the deformation calculation unit and the viewpoint change elimination unit through sequential selection of different first images from the first image group and sequential selection of different second images from the second image group.