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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11913991 B1

PDFFull Text
Date of Patent:
Feb. 27, 2024

Filed:

Nov. 01, 2018

Rotating electric machine test method, rotating electric machine test device, and rotating electric machine

Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Norihiko Hana, Tokyo, JP;

Masao Akiyoshi, Tokyo, JP;

Yoshihide Kikuichi, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;

Attorney:

XSENSUS LLP

Primary Examiner:

Maurice C Smith

Int. Cl.
CPC ...
G01N 3/00 (2006.01); G01R 31/34 (2020.01); G06T 7/00 (2017.01); H02K 1/22 (2006.01); G01L 1/24 (2006.01); G01M 5/00 (2006.01); G01B 5/30 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01R 31/343 (2013.01); G01B 5/30 (2013.01); G01B 11/16 (2013.01); G01L 1/24 (2013.01); G01M 5/0033 (2013.01); G01N 3/00 (2013.01); G06T 7/001 (2013.01); H02K 1/22 (2013.01); G01N 2203/0062 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A rotating electric machine includes a stator and a rotor. An imaging device images a test target portion which is a part of the rotor, to generate image data of the test target portion, and transmits the generated image data to an image processing device. The image processing device generates strain change information representing change in the strain distribution in the test target portion by digital image correlation on the basis of the test image data generated by the imaging device. The state of the rotor is tested using the generated strain change information.

Find Patent Forward Citations

Hana, Norihiko. (2024). Rotating electric machine test method, rotating electric machine test device, and rotating electric machine (U.S. Patent No. 11913991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11913991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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