The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jan. 31, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Norihiko Hana, Tokyo, JP;

Masao Akiyoshi, Tokyo, JP;

Kenji Amaya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G01N 2203/0017 (2013.01); G01N 2203/0066 (2013.01);
Abstract

Provided are a shape model setting circuitry for setting a shape model of a target structure, a crack candidate plane in the shape model, and an observation plane of the shape model, an estimation model generator for generating an estimation model obtained from a numerical analysis of a structural analysis model by sequentially changing a boundary condition of the crack candidate plane in the structural analysis model generated from the shape model, and a crack state analyzer for estimating a position and a size of the crack by obtaining a distribution of load and displacement in the crack candidate plane at the same time by probabilistic inference through the application of an observation plane deformation vector indicating deformation of the observation plane obtained from measurement values, the estimation model, and a latent variable indicating presence or absence of the crack in the crack candidate plane.


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