The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Sep. 16, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
MITSUBISHI ELECTRIC RESEARCH LABORATORIES, INC., Cambridge, MA (US);
Abstract
A measurement device is configured to set an observation surface on a surface of a structure as a measurement surface to measure a change of the measurement surface as a measurement surface change vector. An estimator is configured to generate an estimation model based on a shape model obtained by modeling a shape of the structure. The estimator is configured to acquire a coefficient vector by solving a norm minimization problem by setting, as parameters, a measurement surface change vector and a part of the estimation model. The coefficient vector forms a sparse solution. The estimator is configured to estimate a change of a crack occurrence surface by determining a candidate surface, which is inside the structure and assumed to have a crack, as the crack occurrence surface, based on the coefficient vector and another part of the estimation model.