The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Sep. 16, 2020
Mitsubishi Electric Corporation, Tokyo, JP;
Norihiko Hana, Tokyo, JP;
Masao Akiyoshi, Tokyo, JP;
Masaki Umeda, Tokyo, JP;
Kenji Amaya, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A crack estimation device which accurately estimates a crack inside a structure is provided. The crack estimation device includes: a measurement unit which measures deformation of a measurement plane as a measurement plane deformation vector; a model generation unit which sets deformation of the measurement plane when a crack is generated in a crack generation plane, as a measurement plane estimated change vector for multiple types of crack candidates; and a crack state analysis unit which obtains a similarity between the measurement plane deformation vector and the measurement plane estimated change vector, normalizes the similarity, and estimates the crack generated in the crack generation plane from a result obtained by multiplying a vector of a state quantity indicating a state of the crack generation plane by the normalized similarity for each crack candidate, and adding together results of the multiplication for all the crack candidates.