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For the Inventor, By the Inventor

Rotterdam, Netherlands

Mohammadreza Hajiahmadi

USPTO Granted Patents = 11 

Average Co-Inventor Count = 4.3

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:

goldMedal11 out of 4,883 
 
Asml Netherlands B.v.
 patents

Years Active: 2019-2025

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11 patents (USPTO):
1. 12379670 - Substrate, patterning device and metrology apparatuses (2025-08-05),
2. 12112260 - Metrology apparatus and method for determining a characteristic of one or more structures on a substrate (2024-10-08),
3. 12105432 - Metrology method and associated computer product (2024-10-01),
4. 11448974 - Metrology parameter determination and metrology recipe selection (2022-09-20),
5. 11181828 - Method of determining a value of a parameter of interest of a patterning process, device manufacturing method (2021-11-23),
6. 11009345 - Metrology method, apparatus, and computer program to determine a representative sensitivity coefficient (2021-05-18),
7. 10990020 - Metrology parameter determination and metrology recipe selection (2021-04-27),
8. 10794693 - Metrology method, apparatus and computer program (2020-10-06),
9. 10705437 - Metrology method and apparatus, computer program and lithographic system (2020-07-07),
10. 10481506 - Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing method (2019-11-19),
11. 10451978 - Metrology parameter determination and metrology recipe selection (2019-10-22),

Title: Mohammadreza Hajiahmadi: Pioneering Innovator in Metrology Technology

Introduction:

Mohammadreza Hajiahmadi, a brilliant inventor based in Rotterdam, NL, has made significant strides in the field of metrology technology. With a remarkable total of 8 patents to his name, his innovative spirit and dedication to pushing the boundaries of what is possible have established him as a true pioneer in the world of inventions and technology.

Latest Patents:

Hajiahmadi's latest patents showcase his expertise in metrology technology. One patent involves a method for determining a patterning process parameter from a metrology target using diffraction radiation values under different illumination conditions. Another patent details techniques for determining parameters of interest in a patterning process using calibration data units and measurement data units.

Career Highlights:

Currently working at ASML Netherlands B.V., Hajiahmadi has been instrumental in driving innovation in the field of metrology technology. His contributions have led to the development of cutting-edge solutions that enhance the accuracy and efficiency of patterning processes in device manufacturing.

Collaborations:

Throughout his career, Hajiahmadi has collaborated with talented individuals such as Murat Bozkurt and Narjes Javaheri. These collaborations have not only enriched his own work but have also contributed to the advancement of metrology technology as a whole.

Conclusion:

In conclusion, Mohammadreza Hajiahmadi's relentless pursuit of innovation and his commitment to excellence have cemented his reputation as a pioneering innovator in the field of metrology technology. His impactful inventions continue to shape the future of technology and inspire the next generation of inventors.

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