Makoto Doi

Title: The Innovative Contributions of Makoto Doi

Introduction

Makoto Doi is a prominent inventor based in Takatsuki, Japan. He has made significant contributions to the field of X-ray fluorescence spectrometry, holding a total of 5 patents. His work focuses on developing advanced techniques for analyzing materials and detecting contamination.

Latest Patents

One of Doi's latest patents is an X-ray fluorescence spectrometer that features an exclusion module. This module is designed to calculate the coating amount of each component not contained in the base layers. It does this by assuming that the component solely makes up the thin film and adopts a maximum coating amount as the initial value. If errors occur in the calculation results, the component is excluded from analysis targets.

Another notable patent is for a total reflection X-ray fluorescence spectrometer and estimation method. This invention allows for the quick and easy estimation of contamination on a substrate using a machine learning device. The spectrometer includes a spectrum acquisition unit and a learning unit that generates estimation data based on input spectra. This innovative approach enhances the efficiency of contamination detection.

Career Highlights

Throughout his career, Makoto Doi has worked with reputable companies such as Rigaku Corporation and Rigaku Industrial Corporation. His experience in these organizations has contributed to his expertise in the field of X-ray fluorescence technology.

Collaborations

Doi has collaborated with notable colleagues, including Shinya Hara and Yasujiro Yamada. These partnerships have likely fostered innovation and the exchange of ideas in their respective fields.

Conclusion

Makoto Doi's contributions to the field of X-ray fluorescence spectrometry demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of material analysis and contamination detection, making him a valuable figure in the scientific community.