The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2011
Filed:
Nov. 24, 2006
Yoshiyuki Kataoka, Takatsuki, JP;
Hisayuki Kohno, Takatsuki, JP;
Noboru Yamashita, Takatsuki, JP;
Makoto Doi, Takatsuki, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Hisayuki Kohno, Takatsuki, JP;
Noboru Yamashita, Takatsuki, JP;
Makoto Doi, Takatsuki, JP;
Rigaku Industrial Corporation, Tokyo, JP;
Abstract
An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube () having a target with an element including chromium, an X-ray filter () disposed on a path of travel of X-rays between the X-ray tube () and the sample (S) and having a predetermined transmittance for Cr—Kα line from the X-ray tube () and made of a material which is an element of which absorption edges do not exist between energies of S—Kα line and Cr—Kα line, and a proportional counter () having a detector gas containing a neon gas or a helium gas.