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Rigaku Industrial Corporation

USPTO Granted Patents = 29

% Expired Patents = 24.1

Trademarks = 3

Forward Citations = 302

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48 inventors (with patents filed for the assignee):

Naoki Kawahara (5 out of 8 patents)

Takashi Shoji (5 out of 5 patents)

Yoshiyuki Kataoka (4 out of 17 patents)

4. Yasujiro Yamada (4 out of 13 patents)

5. Tadashi Utaka (4 out of 5 patents)

6. Hisayuki Kohno (4 out of 4 patents)

7. Motoyuki Yamagami (3 out of 5 patents)

8. Kouichi Aoyagi (3 out of 4 patents)

9. Hiroaki Kita (2 out of 10 patents)

10. Akihiro Ikeshita (2 out of 4 patents)

11. Makoto Doi (2 out of 5 patents)

12. Kazuaki Shimizu (2 out of 2 patents)

13. Akira Arake (2 out of 2 patents)

14. Koushi Sumii (2 out of 2 patents)

15. Takao Moriyama (1 out of 2 patents)

Core Competencies:

X-Ray Fluorescence

Spectrometer

Analyzer

Sample Retainer

Fluorescent X-Ray

Quantitative Measurement

Spectroscopic Element

Irradiating Device

Analyzing Apparatus

Path Switching Device

Radiation Intensity

X-Ray Analysis

29 patents: Sort by Forward Citations

1. 7949093 - X-ray fluorescence spectrometer (2011-05-24),

2. 7848483 - Magnesium silicide-based multilayer x-ray fluorescence analyzers (2010-12-07),

3. 7450685 - X-ray fluorescence spectrometer and program for use therewith (2008-11-11),

4. 7356114 - X-ray fluorescence spectrometer (2008-04-08),

5. 7187751 - X-ray fluorescence spectrometer and program used therein (2007-03-06),

6. 7016463 - Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer therefor (2006-03-21),

7. 6937691 - X-ray fluorescence spectrometric system and a program for use therein (2005-08-30),

8. 6836533 - Multi-layer film spectroscopic element for boron fluorescene X-ray analysis (2004-12-28),

9. 6824746 - High-energy beam irradiating desulfurization device (2004-11-30),

10. 6735276 - Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same (2004-05-11),

11. 6708121 - Analyzing apparatus (2004-03-16),

12. 6700951 - X-ray fluorescence spectrometer (2004-03-02),

13. 6668038 - X-ray fluorescence spectrometer (2003-12-23),

14. 6647090 - X-ray fluorescence spectrometer (2003-11-11),

15. 6611577 - X-ray fluorescence analysis and apparatus therefor (2003-08-26),

Company Overview

Rigaku Industrial Corporation, headquartered in Osaka, Japan, specializes in the development and manufacturing of advanced analytical and measurement instruments. The company focuses on a range of technologies including X-ray diffraction, X-ray fluorescence, and other analytical techniques that serve various industries such as materials science, pharmaceuticals, and semiconductor manufacturing. Rigaku is committed to innovation and precision, providing solutions that enhance research and quality control processes globally.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

29 Patents

#249 in Osaka

#2,359 in Japan

#22,530 in the World

Rigaku Industrial Corporation

Forward Citations = 302

48 inventors:

Naoki Kawahara (5 out of 8 patents)

Takashi Shoji (5 out of 5 patents)

Yoshiyuki Kataoka (4 out of 17 patents)

4. Yasujiro Yamada (4 out of 13 patents)

5. Tadashi Utaka (4 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Rigaku Industrial Corporation. Retrieved from https://idiyas.com/company/rigaku-industrial

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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