The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2008
Filed:
Oct. 17, 2006
Yoshiyuki Kataoka, Takatsuki, JP;
Hisayuki Kohno, Takatsuki, JP;
Masatsugu Kuraoka, Takatsuki, JP;
Takashi Shoji, Takatsuki, JP;
Yasujiro Yamada, Takatsuki, JP;
Yoshiyuki Kataoka, Takatsuki, JP;
Hisayuki Kohno, Takatsuki, JP;
Masatsugu Kuraoka, Takatsuki, JP;
Takashi Shoji, Takatsuki, JP;
Yasujiro Yamada, Takatsuki, JP;
Rigaku Industrial Corporation, Osaka, JP;
Abstract
A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device () which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr—Kα line (), changes depending on the ratio of the concentration of the hexavalent chrome vs. the concentration of the intensity of the total chrome. A plurality of detecting device () having different resolutions as a combination of a divergence slit (), a spectroscopic device (), a receiving slit () and a detector () is provided such that when the change of the peak spectroscopic angle is to be detected, a detecting device (B) having a higher resolution than that of the detecting device (A), which is selected when the concentration or the intensity of the total chrome is to be determined, is selected.