The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
Apr. 22, 2002
Applicant:
Inventors:
Assignee:
Rigaku Industrial Corporation, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/3223 ;
U.S. Cl.
CPC ...
G01N 2/3223 ;
Abstract
To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray source including a primary X-ray limiting diaphragm An aperture of the primary X-ray limiting diaphragm is of a shape effective to allow change in intensity of fluorescent X-rays measured by a detector to be not higher than 1% in the event that a height of the sample surface relative to the X-ray source and the detector changes 1 mm at maximum.