The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2003
Filed:
Feb. 11, 2002
Applicant:
Inventor:
Motoyuki Yamagami, Takatsuki, JP;
Assignee:
Rigaku Industrial Corporation, Takatsuki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/3223 ;
U.S. Cl.
CPC ...
G01N 2/3223 ;
Abstract
In order to render the value of the fluorescent X-ray strength Ia of a standard sample 2 multiplied by the ratio PF /PF between respective grading coefficients of standard samples 1 and 2 to approach the value of the fluorescent X-ray strength Ia of the standard sample 1, specific glancing angles øa* and øb* are determined. The abundance of a substance of interest is determined from fluorescent X-ray strengths Ia and Ib of a sample to be measured that is irradiated at the determined specific glancing angles øa* and øb*, to thereby provide an accurate determination of the abundance of the substance of interest.