The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Sep. 13, 2006
Yoshiyuki Kataoka, Takatsuki, JP;
Eiichi Furusawa, Takatsuki, JP;
Hisayuki Kohno, Takatsuki, JP;
Rigaku Industrial Corporation, Osaka, JP;
Abstract
An X-ray fluorescence spectrometer includes an X-ray sourcefor irradiating a sampleat a predetermined incident angle ø with primary X-rays, and a detecting devicefor measuring an intensity of fluorescent X-raysgenerated from the sample at a predetermined detection angle α and β, wherein with two combinations of the incident angle ø and the detection angle α and β, in which combinations the incident angles ø and/or the detection angles α and β are different from each other, each intensity of the fluorescent X-raysis measured and, also, the incident angle ø and the detection angle α and β in each of the combination are so set that with respect to a measurement depth represented by the coating weight, at which the intensity of the fluorescent X-raysattains a value equal to 99% of the uppermost limit when the coating weight of a target coating to be measured is increased, respective measurement depths in the two combinations may be a value greater than the coating weight of a coating