Takatsuki, Japan

Eiichi Furusawa

This inventor holds 1 USPTO granted patent. Top assignee: Rigaku Industrial Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichi Furusawa. Retrieved from https://idiyas.com/inventor/eiichi-furusawa-p958598e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Eiichi Furusawa

Introduction

Eiichi Furusawa is a notable inventor based in Takatsuki, Japan. He has made significant contributions to the field of X-ray technology, particularly through his innovative designs and patents. His work has had a profound impact on the way X-ray fluorescence spectrometers are developed and utilized.

Latest Patents

Furusawa holds a patent for an X-ray fluorescence spectrometer. This device includes an X-ray source that irradiates a sample at a predetermined incident angle with primary X-rays. It also features a detecting device that measures the intensity of fluorescent X-rays generated from the sample at specific detection angles. The design allows for the measurement of fluorescent X-ray intensity at different combinations of incident and detection angles, enhancing the accuracy and depth of measurement in various applications.

Career Highlights

Eiichi Furusawa is associated with Rigaku Industrial Corporation, a company known for its advancements in analytical and measurement technologies. His work at Rigaku has positioned him as a key figure in the development of innovative X-ray instruments.

Collaborations

Furusawa has collaborated with notable colleagues such as Yoshiyuki Kataoka and Hisayuki Kohno. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Eiichi Furusawa's contributions to the field of X-ray technology exemplify the spirit of innovation. His patent for the X-ray fluorescence spectrometer showcases his commitment to advancing measurement techniques. Through his work and collaborations, he continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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