Maarten Kuijper

This inventor holds 34 USPTO granted patents and 4 published patent applications, plus 2 CIPO patents and 9 EPO patents, primarily in Cryogenic Sample Preparation. Top assignees: Fei Comapny, Koninklijke Philips Corporation N.v., Lite-On It Corporation. Active years: 2001-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Maarten Kuijper. Retrieved from https://idiyas.com/inventor/maarten-kuijper

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 34 (Patent Applications = 4)

% Patents Active = 50.0

CIPO Patents = 2 (Patent Applications = 2)

EPO Patents = 9 (Patent Applications = 12)

Average Co-Inventor Count = 2.4

ph-index = 3

Forward Citations = 48(Granted Patents)

Location History:

Dordrecht, NL (2008)
Taipei, TW (2012)
Helmond, NL (2010 - 2022)
Eindhoven, NL (2001 - 2024)

Company Filing History:

Koninklijke Philips Corporation N.v.

patents

9 out of 305

Lite-On It Corporation

patents

4. 1 out of 28

Philips & Lite-on Digital Solutions Corporation

patents

5. 1 out of 14,087

U.S. Philips Corporation

patents

Years Active: 2001-2026

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Areas of Expertise:

Cryogenic Sample

Electron Microscopy

Diffraction Detection

Optical Record Carrier

Image Projection

Data Detection

Cooling Characteristics

Optical Disk Drive

Focus Optimization

Particle Microscope

Helical Tomography

Multi Modal GUID Grid

34 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12703197 - Blotting material with profiled region, method of manufacturing same, and uses thereof (2026-08-11),

2. 12270602 - Method of preparing a cryogenic sample with improved cooling characteristic (2025-04-08),

3. 11994341 - Method of preparing a cryogenic sample with improved cooling characteristic (2024-05-28),

4. 11587762 - Device and method for determining a property of a sample that is to be used in a charged particle microscope (2023-02-21),

5. 11430633 - Illumination apertures for extended sample lifetimes in helical tomography (2022-08-30),

6. 11101104 - Multi modal cryo compatible GUID grid (2021-08-24),

7. 11004655 - Diffraction pattern detection in a transmission charged particle microscope (2021-05-11),

8. 10921268 - Methods and devices for preparing sample for cryogenic electron microscopy (2021-02-16),

9. 10832901 - EELS detection technique in an electron microscope (2020-11-10),

10. 10651008 - Diffraction pattern detection in a transmission charged particle microscope (2020-05-12),

11. 10389955 - Method for detecting particulate radiation (2019-08-20),

12. 10122946 - Method for detecting particulate radiation (2018-11-06),

13. 9431048 - Detection of data in burst cutting area of optical disk (2016-08-30),

14. 8624183 - Determining a reconstructed image with viterbi detection using a particle-optical apparatus (2014-01-07),

15. 8611195 - Detection of data in burst cutting area of optical disk (2013-12-17),

Title: The Innovative Journey of Maarten Kuijper

Introduction

Maarten Kuijper, an accomplished inventor based in Eindhoven, Netherlands, has made significant strides in the field of cryogenics and microscopy. With a remarkable portfolio of 32 patents, his innovative methods and devices showcase his dedication to advancing technology and improving scientific processes.

Latest Patents

Among his latest developments is a patent for a "Method of preparing a cryogenic sample with improved cooling characteristics." This invention outlines a unique method and apparatus for rapid cooling of samples using cryogenic fluids. The design features a pair of conduits that deliver cryogenic fluid through mouthpieces positioned to face each other, allowing for concurrent immersion of a sample placed on a planar carrier. This setup enhances the cooling efficiency through specially designed nozzle openings.

Another noteworthy patent is the "Device and method for determining a property of a sample that is to be used in a charged particle microscope." This invention introduces a new device that utilizes a light source to emit beams towards a sample and a detector to analyze the emitted light. It aims to determine the properties of a matrix layer within the sample, showcasing Kuijper's innovative approach to enhancing charged particle microscopy.

Career Highlights

Maarten Kuijper has built a distinguished career through his work at esteemed companies such as FEI Company and Koninklijke Philips Corporation N.V. His contributions have not only expanded the intellectual property landscape but have also driven advancements in imaging technologies and material analysis.

Collaborations

Throughout his career, Kuijper has collaborated with notable professionals, including Bart Van Rompaey and Jacobus Petrus Josephus Heemskerk. Their collective efforts have likely fostered an environment of creativity and innovation, resulting in groundbreaking advancements in their respective fields.

Conclusion

In summary, Maarten Kuijper stands out as a pioneering inventor whose work continues to impact the fields of cryogenics and microscopy. His extensive patent portfolio is a testament to his innovative spirit and commitment to scientific advancement. As he moves forward, the industry will eagerly anticipate his future contributions and their implications for technology.

Profile summary based on public USPTO records.