The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Sep. 09, 2019
Fei Company, Hillsboro, OR (US);
Bas Hendriksen, Eindhoven, NL;
Maarten Kuijper, Eindhoven, NL;
Luigi Mele, Eindhoven, NL;
Pleun Dona, Eindhoven, NL;
Erum Raja, Rockford, IL (US);
Atieh Aminian, Eindhoven, NL;
FEI Company, Hillsboro, OR (US);
Abstract
Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.