Company Filing History:
Years Active: 2021
Title: The Innovations of Bas Hendriksen
Introduction
Bas Hendriksen is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of electron microscopy, holding 2 patents that showcase his innovative approach to enhancing imaging techniques. His work is characterized by a focus on laser-based technologies and cryogenic sample preparation.
Latest Patents
Hendriksen's latest patents include "Laser-based phase plate image contrast manipulation" and "Methods and devices for preparing samples for cryogenic electron microscopy." The first patent details methods and systems for implementing laser-based phase plate image contrast enhancement. This method involves forming optical peaks in a diffraction plane of an electron microscope and directing an electron beam through these peaks to manipulate the phase imparted to the electrons. The second patent provides various methods and devices for optimizing sample conditions for cryogenic electron microscopy. It describes a sample inspection device that can screen multiple samples with different conditions, utilizing a chamber formed between electron transparent layers.
Career Highlights
Bas Hendriksen is currently employed at FEI Company, where he continues to push the boundaries of electron microscopy technology. His work has been instrumental in advancing the capabilities of imaging systems, making significant impacts in both research and practical applications.
Collaborations
Hendriksen collaborates with talented individuals such as Pleun Dona and Bart Buijsse, contributing to a dynamic and innovative work environment.
Conclusion
Bas Hendriksen's contributions to the field of electron microscopy through his patents and collaborative efforts highlight his role as a leading inventor in this specialized area. His innovative methods continue to enhance the capabilities of imaging technologies, paving the way for future advancements.