Fei Comapny

Bas Hendriksen

Pleun Dona

Bart Buijsse

Maarten Kuijper

Luigi Mele

Erum Raja

Atieh Aminian

Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.

Laser-based phase plate image contrast manipulation

Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.

Methods and devices for preparing sample for cryogenic electron microscopy

Growing community of inventors

Eindhoven, Netherlands

Bas Hendriksen