Fei Comapny

Koninklijke Philips Corporation N.v.

Lite-on It Corporation

U.S. Philips Corporation

Philips & Lite-on Digital Solutions Corporation

Maarten Kuijper

Bart Van Rompaey

Josephus Arnoldus Henricus Maria Kahlman

Cornelis Marinus Schep

Jacobus Petrus Josephus Heemskerk

Bart Buijsse

Tony Petrus Van Endert

Johannes Leopoldus Bakx

Pleun Dona

Bart Jozef Janssen

Erik Michiel Franken

Mathijs Petrus Wilhelmus Van Den Boogaard

Markus Wilhelmus Maria Coopmans

Ondrej Ludmil Shanel

Lingbo Yu

Marius Van Der Does

Mathias Martinus Maria Timmermans

Johannes Francicus Petrus Claas

Ivanka Spee

Adrian Koh

Hervé Remigy

John Hazenberg

Aalbert Stek

Peter Christiaan Tiemeijer

Sjoerd Stallinga

Bert Henning Freitag

Josephus A H M Kahlman

Trond Karsten Varslot

Gerard Nicolaas Anne Van Veen

Jacobus P J Heemskerk

Luigi Mele

Andrei Mijiritskii

Sorin Lazar

Petrus Henricus Cornelius Bentvelsen

Sung-Yao Lin

Johannes Franciscus Petrus Claas

Petrus Antonius Verbeek

Ondrej R Baco

Erum Raja

Antoon Dekker

Stefan Geusens

Stephan Kujawa

Bas Hendriksen

Jamie McCormack

Martin Schneider

Geert Luyten

Alberto Martin-Consuegra Granados

Mathijs Petrus Van Den Boogaard

Erwin Lekens

Balakumaran Natanasigamani

Jos Berckmans

Václav Batelka

Matthijn Robert-Jan Vos

Ondrej Ludmil Shànël

Peet Goedendorp

Atieh Aminian

Ron Van Den Bogaard

Erik Franken

The invention relates to a method and an apparatus for preparing a cryogenic sample, whereby the sample is subjected to rapid cooling using a cryogen. A pair of conduits for transporting cryogenic fluid are provided, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap, wherein in the gap a sample that is provided on a substantially planar sample carrier can be received. Cryogenic fluid can be pumped through the conduits so as to concurrently flush from the mouthpieces and suddenly immerse the sample in cryogenic fluid from two opposite sides. As defined herein, at least one of the mouthpieces comprises at least two nozzle openings for evenly cooling the substantially planar sample carrier during the flushing.

Method of preparing a cryogenic sample with improved cooling characteristic

The invention relates to a method and an apparatus for preparing a cryogenic sample, whereby the sample is subjected to rapid cooling using a cryogen. A pair of conduits for transporting cryogenic fluid are provided, each of which conduits opens out into a mouthpiece, which mouthpieces are arranged to face each other across an intervening gap, wherein in said gap a sample that is provided on a substantially planar sample carrier can be received. Cryogenic fluid can be pumped through said conduits so as to concurrently flush from said mouthpieces and suddenly immerse the sample in cryogenic fluid from two opposite sides. As defined herein, at least one of said mouthpieces comprises at least two nozzle openings for evenly cooling said substantially planar sample carrier during said flushing.

The invention relates to a device and method for determining a property of a sample that is to be used in a charged particle microscope. The sample comprises a specimen embedded within a matrix layer. The device comprises a light source arranged for directing a beam of light towards said sample, and a detector arranged for detecting light emitted from said sample in response to said beam of light being incident on said sample. Finally, the device comprises a controller that is connected to said detector and arranged for determining a property of said matrix layer based on signals received by said detector.

Device and method for determining a property of a sample that is to be used in a charged particle microscope

Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.

Illumination apertures for extended sample lifetimes in helical tomography

Cryo compatible sample grids having multi-modal cryo-EM compatible GUIDs, according to the present disclosure include an outer support structure that defines a region of the grid for holding one or more samples, and a plurality of inner support structures that define a plurality of apertures that are each configured to hold a sample. Cryo compatible sample grids further include a first identifier located on the outer support structure, and a second identifier located within the region of the grid for holding the one or more samples. The first identifier is readable with an optical detector, while the second identifier is readable with an electron detector (e.g., within an electron microscope). Specifically, the second identifier is readable with an electron detector when one or more teeth and/or holes that comprise the second identifier are filled with ice from a vitrification process.

Multi modal cryo compatible GUID grid

Techniques of using a Transmission Charged Particle Microscope for diffraction pattern detection are disclosed. An example method including irradiating at least a portion of a specimen with a charged particle beam, using an imaging system to collect charged particles that traverse the specimen during said irradiation, and to direct them onto a detector configured to operate in a particle counting mode, using said detector to record a diffraction pattern of said irradiated portion of the specimen, recording said diffraction pattern iteratively in a series of successive detection frames, and during recording of each frame, using a scanning assembly for causing relative motion of said diffraction pattern and said detector, so as to cause each local intensity maximum in said pattern to trace out a locus on said detector.

Diffraction pattern detection in a transmission charged particle microscope

Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.

Methods and devices for preparing sample for cryogenic electron microscopy

A method of performing Electron Energy-Loss Spectroscopy (EELS) in an electron microscope, comprising: specifically comprising:

EELS detection technique in an electron microscope

When detecting particulate radiation, such as electrons, with a pixelated detector, a cloud of electron/hole pairs is formed in the detector. Using the signal caused by this cloud of electron/hole pairs, a position of the impact is estimated. When the size of the cloud is comparable to the pixel size, or much smaller, the estimated position shows a strong bias to the center of the pixel and the corners, as well to the middle of the borders. This hinders forming an image with super-resolution. By shifting the position or by attributing the electron to several sub-pixels this bias can be countered, resulting in a more truthful representation.

Method for detecting particulate radiation

An apparatus generates outgoing data to be provided on an optical disk in a burst cutting area. The burst cutting area further comprises markings which cause a marking frequency spectrum when reading out the burst cutting area. The apparatus comprises a channel coder which receives processed data and supplies the outgoing data having an outgoing data frequency spectrum with suppressed DC-content. The apparatus further comprises a data processing device which generates the processed data to obtain an outgoing frequency spectrum wherein a frequency component causing interference with a low frequent component of the markings is suppressed or not present.

Detection of data in burst cutting area of optical disk

The invention relates to a method for determining a reconstructed image using a particle-optical apparatus. The particle-optical apparatus comprises a particle source for producing a beam of particles, an object plane on which an object to be imaged may be placed, a condenser system for illuminating the object plane with the beam of particles, a projection system for forming an image of the object plane by imaging particles transmitted through the object on an image plane, and a detector for detecting the image, the detector comprising a semiconductor sensor having an array of pixels for providing a plurality of pixel signals from respective pixels of the array in response to particles incident on the detector.

Determining a reconstructed image with viterbi detection using a particle-optical apparatus

An apparatus generates outgoing data (OD) to be provided on an optical disk () in a burst cutting area (). The burst cutting area () further comprises markings () which cause a marking frequency spectrum (MFS) when reading out the burst cutting area (). The apparatus comprises a channel coder () which receives processed data (PD) and supplies the outgoing data (OD) having an outgoing data frequency spectrum (DFS) with suppressed DC-content. The apparatus further comprises a data processing device () which generates the processed data (PD) to obtain an outgoing frequency spectrum (DFS) wherein a frequency component causing interference with a low frequent component of the markings () is suppressed or not present.

A method and system for obtaining focus optimization in an optical disc system is disclosed. The focus offset of a recording unit is set to a first of a plurality of predetermined values. A HF quality value is measured and stored for the selected focus offset value of the recording unit. The focus offset is then set to a best-known focus offset value. Tracks on the optical media being read are then jumped. The above steps are then repeated for each of the plurality of predetermined focus offset values. The optimal focus setting is then determined from the stored HF quality measurements.

Focus optimization routine with sub-optimal jump settings in optical disc systems

Growing community of inventors

Eindhoven, Netherlands

Maarten Kuijper