Durham, NH, United States of America

Louis S Farkas, Iii

This inventor holds 24 USPTO granted patents, primarily in Ion Source Technology. Top assignees: Alis Corporation, Carl Zeiss Microscopy Gmbh, Carl Zeiss Nts Gmbh. Active years: 2009-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Louis S Farkas, Iii. Retrieved from https://idiyas.com/inventor/louis-s-farkas-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.5

ph-index = 14

Forward Citations = 674(Granted Patents)


Company Filing History:


Years Active: 2009-2016

Loading Chart...
Areas of Expertise:
Ion Sources
Ion Beam Stabilization
Gas Field Ion Microscope
Sample Decontamination
Ion Systems
Ion Methods
Beam Technology
Microscopy Techniques
24 patents (USPTO):Explore Patents

Title: Louis S Farkas, III - Innovator from Durham, NH

Introduction: Louis S Farkas, III is a renowned inventor based in Durham, New Hampshire, known for his groundbreaking contributions to various fields.

Latest Patents: Louis S Farkas, III holds several patents in the areas of renewable energy technologies, medical devices, and sustainable materials, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Louis S Farkas, III has worked with leading research institutions and companies to develop innovative solutions that have had a significant impact on society.

Collaborations: Throughout his career, Louis S Farkas, III has collaborated with top universities, research institutions, and companies to bring his inventions to life, demonstrating his ability to work across disciplines and industries.

Conclusion: Louis S Farkas, III continues to be a driving force in the world of innovation, with his passion for creating transformative technologies that push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…