The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Dec. 23, 2011
Applicants:
Fhm-faridur Rahman, Peabody, MA (US);
Louis S. Farkas, Iii, Durham, NH (US);
John A. Notte, Iv, Gloucester, MA (US);
Inventors:
FHM-Faridur Rahman, Peabody, MA (US);
Louis S. Farkas, III, Durham, NH (US);
John A. Notte, IV, Gloucester, MA (US);
Assignee:
Carl Zeiss Microscopy, LLC, Thornwood, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Ion microscope methods and systems are disclosed. In general, the systems and methods provide high ion beam stability.