The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Aug. 27, 2009
Applicants:
Fhm-faridur Rahman, Peabody, MA (US);
Louis S. Farkas, Iii, Durham, NH (US);
John A. Notte, Iv, Gloucester, MA (US);
Inventors:
FHM-Faridur Rahman, Peabody, MA (US);
Louis S. Farkas, III, Durham, NH (US);
John A. Notte, IV, Gloucester, MA (US);
Assignee:
Carl Zeiss NTS, LLC, Peabody, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
Ion microscope methods and systems are disclosed. In general, the systems and methods provide high ion beam stability.
Rahman, FHM-Faridur. (2012). Ion beam stabilization (U.S. Patent No. 8093563). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8093563
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile