For the Inventor, By the Inventor

Enter assignee name

Oberkochen, Germany

Carl Zeiss Nts Gmbh

USPTO Granted Patents = 75

EPO Patents = 28

Trademarks = 5

Forward Citations = 633

Loading Chart...

Loading Chart...

105 inventors (with patents filed for the assignee):

Dirk Preikszas (12 out of 33 patents)

Rainer K Knippelmeyer (10 out of 30 patents)

Volker Drexel (8 out of 14 patents)

4. John Anthony Notte, Iv (6 out of 51 patents)

5. Gerd Ludwig Benner (5 out of 27 patents)

6. Oliver Kienzle (5 out of 19 patents)

7. Michael Steigerwald (5 out of 10 patents)

8. Michael Albiez (4 out of 15 patents)

9. Ulrike Zeile (4 out of 10 patents)

10. Johannes Bihr (4 out of 8 patents)

11. Peter Hoffrogge (4 out of 5 patents)

12. Lawrence Scipioni (3 out of 18 patents)

13. Armin Heinz Hayn (3 out of 7 patents)

14. Harald Rose (3 out of 32 patents)

15. Edward Principe (3 out of 3 patents)

Core Competencies:

Particle Beam Device

Nanopore Fabrication

Charged Particle Beams

Phase Contrast Electron Microscope

Gas Field Ion Source

Scanning Electron Microscope

FIB-SEM Tomography

Electron Beam Source

Sample Analysis

Image Processing

Optical Microscope

Material Processing

75 patents: Sort by Forward Citations

1. 9190242 - Particle beam device having a sample holder (2015-11-17),

2. 8894796 - Nanopore fabrication and applications thereof (2014-11-25),

3. 8859992 - Charged particle beam devices (2014-10-14),

4. 8779381 - Aperture unit for a particle beam device (2014-07-15),

5. 8530856 - Beam device system comprising a particle beam device and an optical microscope (2013-09-10),

6. 8487252 - Particle beam microscope and method for operating the particle beam microscope (2013-07-16),

7. 8421028 - Device for deflecting or guiding in a particle beam (2013-04-16),

8. 8405045 - Particle beam device with deflection system (2013-03-26),

9. 8399834 - Isotope ion microscope methods and systems (2013-03-19),

10. 8390152 - Device and method for generating a stable high voltage (2013-03-05),

11. 8384029 - Cross-section systems and methods (2013-02-26),

12. 8334701 - Repairing defects (2012-12-18),

13. 8330105 - Phase contrast electron microscope (2012-12-11),

14. 8314403 - Gas field ion source with coated tip (2012-11-20),

15. 8304750 - Scanning charged particle beams (2012-11-06),

Carl Zeiss NTS GmbH is a leading provider of innovative electron and ion beam imaging and analysis solutions. With cutting-edge technology, their scanning electron microscopes (SEM) and focused ion beam (FIB) systems serve various industries including materials science, semiconductor manufacturing, and life sciences. The company's solutions enable high-resolution imaging, elemental analysis, and nanofabrication to support research, quality control, and process optimization in a wide range of applications.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Jan 6 2026

75 Patents

#6 in Oberkochen

#800 in Germany

#9,739 in the World

Oberkochen, Germany

Carl Zeiss Nts Gmbh

Forward Citations = 633

105 inventors:

Dirk Preikszas (12 out of 33 patents)

Rainer K Knippelmeyer (10 out of 30 patents)

Volker Drexel (8 out of 14 patents)

4. John Anthony Notte, Iv (6 out of 51 patents)

5. Gerd Ludwig Benner (5 out of 27 patents)

Please report any incorrect information to support@idiyas.com

Loading…