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For the Inventor, By the Inventor

Oberkochen, Germany

Carl Zeiss Nts Gmbh

USPTO Granted Patents = 75

% Expired Patents = 25.3


Trademarks = 5

Forward Citations = 668

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105 inventors (with patents filed for the assignee):

goldMedal Dirk Preikszas (12 out of 33 patents)

silverMedal Rainer K Knippelmeyer (10 out of 30 patents)

bronzeMedal Volker Drexel (8 out of 14 patents)

4.  John Anthony Notte, Iv (6 out of 51 patents)

5.  Gerd Ludwig Benner (5 out of 27 patents)

6.  Oliver Kienzle (5 out of 19 patents)

7.  Michael Steigerwald (5 out of 10 patents)

8.  Michael Albiez (4 out of 15 patents)

9.  Ulrike Zeile (4 out of 10 patents)

10.  Johannes Bihr (4 out of 8 patents)

11.  Peter Hoffrogge (4 out of 6 patents)

12.  Lawrence Scipioni (3 out of 18 patents)

13.  Armin Heinz Hayn (3 out of 7 patents)

14.  Harald Rose (3 out of 32 patents)

15.  Edward Principe (3 out of 3 patents)


Core Competencies:
Particle Beam Device
Electron Microscope
Nanopore Fabrication
Charged Particle Beams
Phase Contrast
FIB-SEM Tomography
Deflection System
Sample Holder
Material Processing
High Voltage Generation
Optical Microscope
Image Processing

75 patents:

1. 9190242 - Particle beam device having a sample holder (2015-11-17),
2. 8894796 - Nanopore fabrication and applications thereof (2014-11-25),
3. 8859992 - Charged particle beam devices (2014-10-14),
4. 8779381 - Aperture unit for a particle beam device (2014-07-15),
5. 8530856 - Beam device system comprising a particle beam device and an optical microscope (2013-09-10),
6. 8487252 - Particle beam microscope and method for operating the particle beam microscope (2013-07-16),
7. 8421028 - Device for deflecting or guiding in a particle beam (2013-04-16),
8. 8405045 - Particle beam device with deflection system (2013-03-26),
9. 8399834 - Isotope ion microscope methods and systems (2013-03-19),
10. 8390152 - Device and method for generating a stable high voltage (2013-03-05),
11. 8384029 - Cross-section systems and methods (2013-02-26),
12. 8334701 - Repairing defects (2012-12-18),
13. 8330105 - Phase contrast electron microscope (2012-12-11),
14. 8314403 - Gas field ion source with coated tip (2012-11-20),
15. 8304750 - Scanning charged particle beams (2012-11-06),
Company Overview
Carl Zeiss Nts Gmbh, based in Oberkochen, Germany, specializes in advanced particle beam technology, focusing on the development and manufacturing of high-precision instruments. The company is renowned for its expertise in electron microscopy, offering innovative solutions for nanostructure fabrication and analysis. Key technology areas include charged particle beams, phase contrast techniques, and FIB-SEM tomography, enabling detailed material characterization and imaging for various scientific and industrial applications.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Carl Zeiss Nts Gmbh USPTO Patent Assignee Logo
75 Patents

#5 in Oberkochen

#769 in Germany

#10,023 in the World

Oberkochen, DE
Oberkochen, Germany

Carl Zeiss Nts Gmbh

Forward Citations = 668

105 inventors:

goldMedal Dirk Preikszas (12 out of 33 patents)

silverMedal Rainer K Knippelmeyer (10 out of 30 patents)

bronzeMedal Volker Drexel (8 out of 14 patents)

4.  John Anthony Notte, Iv (6 out of 51 patents)

5.  Gerd Ludwig Benner (5 out of 27 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Carl Zeiss Nts Gmbh. Retrieved from https://idiyas.com/company/carl-zeiss-nts

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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