The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Mar. 20, 2006
Billy W. Ward, Merrimac, MA (US);
Louis S. Farkas, Iii, Durham, NH (US);
John A. Notte, Iv, Gloucester, MA (US);
Randall G. Percival, Raymond, NH (US);
Billy W. Ward, Merrimac, MA (US);
Louis S. Farkas, III, Durham, NH (US);
John A. Notte, IV, Gloucester, MA (US);
Randall G. Percival, Raymond, NH (US);
ALIS Corporation, Peabody, MA (US);
Abstract
In one aspect the invention provides a gas field ion microscope that includes an ion source in connection with an optical column, such that an ion beam generated at the ion source travels through the optical column and impinges on a sample. The ion source includes an emitter having a width that tapers to a tip comprising a few atoms. In other aspects, the invention provides methods for using the ion microscope to analyze samples and enhancing the performance of a gas field ion source.