logo

For the Inventor, By the Inventor

Rochester, MN, United States of America

Louis Bernard Bushard

This inventor holds 13 USPTO granted patents. Top assignees: International Business Machines Corporation, Kabushiki Kaisha Toshiba, Toshiba America Electronic Components, Inc.. Active years: 2003-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Louis Bernard Bushard. Retrieved from https://idiyas.com/inventor/louis-bernard-bushard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 23.1

Average Co-Inventor Count = 3.7

ph-index = 4

Forward Citations = 33(Granted Patents)


Company Filing History:

goldMedal12 out of 166,351 
 
International Business Machines Corporation
 patents
silverMedal2 out of 53,262 
 
Kabushiki Kaisha Toshiba
 patents
bronzeMedal1 out of 63 
 
Toshiba America Electronic Components, Inc.
 patents
where one patent can have more than one assignee

Years Active: 2003-2012

Loading Chart...
13 patents (USPTO):Explore Patents
1. 8117579 - LSSD compatibility for GSD unified global clock buffers (2012-02-14),
2. 7844869 - Implementing enhanced LBIST testing of paths including arrays (2010-11-30),
3. 7797600 - Method and apparatus for testing a ring of non-scan latches with logic built-in self-test (2010-09-14),
4. 7733722 - Apparatus for implementing eFuse sense amplifier testing without blowing the eFuse (2010-06-08),
5. 7689950 - Implementing Efuse sense amplifier testing without blowing the Efuse (2010-03-30),
6. 7562267 - Methods and apparatus for testing a memory (2009-07-14),
7. 7489572 - Method for implementing eFuse sense amplifier testing without blowing the eFuse (2009-02-10),
8. 7406640 - Method and apparatus for testing a ring of non-scan latches with logic built-in self-test (2008-07-29),
9. 7318182 - Memory array manufacturing defect detection system and method (2008-01-08),
10. 7080298 - Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns (2006-07-18),
11. 7055077 - Systems and methods for circuit testing (2006-05-30),
12. 6909274 - Signal pin tester for AC defects in integrated circuits (2005-06-21),
13. 6590382 - Signal pin tester for AC defects in integrated circuits (2003-07-08),

Title: Louis Bernard Bushard: Innovator in Clock Signal Design and Testing Technologies

Introduction

Louis Bernard Bushard is a notable inventor based in Rochester, MN (US), recognized for his contributions to the field of clock signal design and testing technologies. With a total of 13 patents to his name, Bushard has made significant advancements that enhance the functionality and reliability of electronic systems.

Latest Patents

Among his latest patents, Bushard has developed a method for LSSD compatibility for GSD unified global clock buffers. This innovation provides a system and program for generating level sensitive scan design (LSSD) clock signals from a general scan design (GSD) clock buffer. The method utilizes an intermediate clock signal and control signals to produce multiple LSSD clock signals, improving the efficiency of clock signal generation. Another significant patent involves implementing enhanced Logic Built in Self Test (LBIST) testing of paths that include memory arrays. This method and circuit facilitate the testing of circuit paths, ensuring that memory arrays and logic are thoroughly evaluated for performance and reliability.

Career Highlights

Bushard has had a distinguished career, working with prominent companies such as IBM and Kabushiki Kaisha Toshiba. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in the electronics industry.

Collaborations

Throughout his career, Bushard has collaborated with talented individuals, including Naoki Kiryu and Anthony Gus Aipperspach. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Louis Bernard Bushard's work in clock signal design and testing technologies has made a lasting impact on the electronics industry. His innovative patents and collaborations highlight his commitment to advancing technology and improving system reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…