The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2006
Filed:
Feb. 04, 2003
Applicants:
Naoki Kiryu, Austin, TX (US);
Louis B Bushard, Rochester, MN (US);
Inventors:
Naoki Kiryu, Austin, TX (US);
Louis B Bushard, Rochester, MN (US);
Assignees:
Toshiba America Electronic Components, Irvine, CA (US);
International Business Machines Corporaton, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing an electronic circuit includes selecting an input signal using a first multiplexer, selecting a signal to be input to the first multiplexer using at least one other multiplexer, and controlling the at least one other multiplexer using a selection signal output from a control circuit.
Kiryu, Naoki. (2006). Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns (U.S. Patent No. 7080298). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7080298
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile