Company Filing History:
10 out of 641 
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1 out of 2 Years Active: 2002-2020
Title: Innovations of Kurt Lehman: A Pioneer in Imaging Technology
Introduction: Kurt Lehman is a distinguished inventor based in Menlo Park, California, known for his remarkable contributions to the field of imaging technology. With a total of 19 patents to his name, he has significantly advanced the capabilities of semiconductor wafer inspection and high-speed imaging applications.
Latest Patents: Two of Kurt Lehman's latest innovations exemplify his expertise in the field. The first patent, titled "Multi-sensor tiled camera with flexible electronics for wafer inspection," features sensor units that can be disposed of in a support member. Each sensor unit consists of a folded flex board that includes a plurality of laminations and an aperture, with a sensor located over the aperture. This groundbreaking system can be utilized in broadband plasma inspection tools for semiconductor wafers.
The second recent patent, "Integrated multi-channel analog front end and digitizer for high-speed imaging applications," describes a module designed for high-speed image processing. This module integrates an image sensor that generates multiple analog outputs representing an image, alongside several high-density digital devices (HDDs) configured to process these outputs concurrently. Each HDD is equipped with an analog front end (AFE), an analog-to-digital converter (ADC), and a data formatting block, further optimizing signal integrity and achieving high data rates for inspection and metrology applications.
Career Highlights: Kurt Lehman has made significant contributions during his tenure at various organizations, notably at KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. His innovative work in semiconductor inspection technologies has solidified his reputation as a leading inventor in the industry.
Collaborations: Throughout his career, Kurt has collaborated with prominent figures in the field, including Charles L. Chen and Ronald L. Allen. These collaborations have fostered creativity and the development of cutting-edge technologies in imaging and inspection systems.
Conclusion: Kurt Lehman's impactful innovations in imaging technology demonstrate his commitment to advancing semiconductor inspection methodologies. With 19 patents and a track record of collaboration with industry leaders, Lehman continues to inspire future developments within the fields of imaging technology and semiconductor processing.