Company Filing History:

10 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

patents

2 out of 3,781

Renesas Technology Corp.

patents

Years Active: 1997-2005

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12 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6943458 - Semiconductor device and manufacturing method thereof, and registration accuracy measurement enhancement method (2005-09-13),

2. 6849957 - Photomask including auxiliary mark area, semiconductor device and manufacturing method thereof (2005-02-01),

3. 6667505 - Semiconductor device having a plurality of capacitors aligned at regular intervals (2003-12-23),

4. 6607992 - Antireflection coating and semiconductor device manufacturing method (2003-08-19),

5. 6596603 - Semiconductor device and manufacturing method thereof, and registration accuracy measurement enhancement method (2003-07-22),

6. 6323560 - Registration accuracy measurement mark, method of repairing defect of the mark, photomask having the mark, method of manufacturing the photo mask and method of exposure thereof (2001-11-27),

7. 6114072 - Reticle having interlocking dicing regions containing monitor marks and (2000-09-05),

8. 6068952 - Registration accuracy measurement mark, method of repairing defect of (2000-05-30),

9. 5991007 - Step and scan exposure system and semiconductor device manufactured (1999-11-23),

10. 5892291 - Registration accuracy measurement mark (1999-04-06),

11. 5869906 - Registration accuracy measurement mark for semiconductor devices (1999-02-09),

12. 5646452 - Registration accuracy measurement mark for semiconductor devices (1997-07-08),

Title: Koichiro Narimatsu: Innovator in Semiconductor Technology

Introduction

Koichiro Narimatsu is a prominent inventor based in Hyogo, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 12 patents. His work focuses on enhancing the manufacturing processes and accuracy of semiconductor devices.

Latest Patents

Narimatsu's latest patents include innovative solutions such as a semiconductor device and a manufacturing method that improves registration accuracy. This invention addresses lens aberration issues that can hinder the manufacturing process of semiconductor devices. The semiconductor device features an auxiliary mark with an inner mark that has stepped portions designed for detection, along with an outer mark that runs parallel to the inner mark. Another notable patent involves a photomask that includes an auxiliary mark area, which allows for precise measurement of inspection marks in a straightforward manner. This device comprises a device forming area surrounded by a dicing line area, where first and second registration marks are strategically placed.

Career Highlights

Throughout his career, Narimatsu has worked with notable companies such as Mitsubishi Electric Corporation and Renesas Technology Corporation. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Narimatsu has collaborated with esteemed colleagues, including Shigenori Yamashita and Nobuyuki Yoshioka. These partnerships have further enriched his work and advancements in the semiconductor field.

Conclusion

Koichiro Narimatsu's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence the development of more efficient and accurate semiconductor manufacturing processes.

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